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(Ebook) TSV 3D RF Integration: High Resistivity Si Interposer Technology by Shenglin Ma, Yufeng Jin ISBN 9780323996020, 0323996027

  • SKU: EBN-46502776
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Authors:Shenglin Ma, Yufeng Jin
Pages:292 pages.
Year:2022
Editon:1
Publisher:Elsevier
Language:english
File Size:20.54 MB
Format:pdf
ISBNS:9780323996020, 0323996027
Categories: Ebooks

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(Ebook) TSV 3D RF Integration: High Resistivity Si Interposer Technology by Shenglin Ma, Yufeng Jin ISBN 9780323996020, 0323996027

TSV 3D RF Integration: High Resistivity Si Interposer Technologysystematically introduces the design, process development and application verification of high-resistivity silicon interpose technology, addressing issues of high frequency loss and high integration level. The book includes a detailed demonstration of the design and process development of Hr-Si interposer technology, gives case studies, and presents a systematic literature review. Users will find this to be a resource with detailed demonstrations of the design and process development of HR-Si interposer technologies, including quality monitoring and methods to extract S parameters. A series of cases are presented, including an example of an integrated inductor, a microstrip inter-digital filter, and a stacked patch antenna. Each chapter includes a systematic and comparative review of the research literature, offering researchers and engineers in microelectronics a uniquely useful handbook to help solve problems in 3D heterogenous RF integration oriented Hr-Si interposer technology.
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