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(Ebook) Silicon-Based Millimeter-wave Technology: Measurement, Modeling and Applications by M. Jamal Deen (Eds.) ISBN 9780123942982, 0123942985

  • SKU: EBN-4549816
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4.7

22 reviews
Instant download (eBook) Silicon-Based Millimeter-wave Technology: Measurement, Modeling and Applications after payment.
Authors:M. Jamal Deen (Eds.)
Pages:1 pages.
Year:2012
Editon:1
Publisher:Academic Press
Language:english
File Size:14.19 MB
Format:pdf
ISBNS:9780123942982, 0123942985
Categories: Ebooks

Product desciption

(Ebook) Silicon-Based Millimeter-wave Technology: Measurement, Modeling and Applications by M. Jamal Deen (Eds.) ISBN 9780123942982, 0123942985

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field

*Free conversion of into popular formats such as PDF, DOCX, DOC, AZW, EPUB, and MOBI after payment.

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