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Retroreflex Ellipsometry for Nonplanar Surfaces by Chia-Wei Chen ISBN 9783731514022, 3731514028 instant download

  • SKU: EBN-237292790
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Instant download (eBook) Retroreflex Ellipsometry for Nonplanar Surfaces after payment.
Authors:Chia-Wei Chen
Pages:208 pages
Year:2024
Publisher:KIT Scientific Publishing
Language:english
File Size:10.03 MB
Format:pdf
ISBNS:9783731514022, 3731514028
Categories: Ebooks

Product desciption

Retroreflex Ellipsometry for Nonplanar Surfaces by Chia-Wei Chen ISBN 9783731514022, 3731514028 instant download

Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.
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