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(Ebook) Istfa 2008: conference proceedings from the 34th International Symposium for Testing and Failure Analysis by ASM International, ASM International ISBN 9780871707147, 0871707144

  • SKU: EBN-5307900
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Instant download (eBook) Istfa 2008: conference proceedings from the 34th International Symposium for Testing and Failure Analysis after payment.
Authors:ASM International, ASM International
Pages:528 pages.
Year:2008
Editon:1
Publisher:ASM International
Language:english
File Size:82.8 MB
Format:pdf
ISBNS:9780871707147, 0871707144
Categories: Ebooks

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(Ebook) Istfa 2008: conference proceedings from the 34th International Symposium for Testing and Failure Analysis by ASM International, ASM International ISBN 9780871707147, 0871707144

November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USAThis volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results
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