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(Ebook) ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis by ASM International ISBN 9780871707468, 0871707462

  • SKU: EBN-5307888
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Instant download (eBook) ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis after payment.
Authors:ASM International
Pages:485 pages.
Year:2001
Editon:1
Publisher:ASM International
Language:english
File Size:42.48 MB
Format:pdf
ISBNS:9780871707468, 0871707462
Categories: Ebooks

Product desciption

(Ebook) ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis by ASM International ISBN 9780871707468, 0871707462

Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California.
This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis.
The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format.
Contents include:
Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused ion beam (FIB) techniques Failure analysis of micro-electromechanical systems (MEMS) Yield improvement Discretes Defect-based testing Case histories
*Free conversion of into popular formats such as PDF, DOCX, DOC, AZW, EPUB, and MOBI after payment.

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