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(Ebook) X-Ray Scattering from Semiconductors by Paul F. Fewster ISBN 9781860943607, 1860943608

  • SKU: EBN-989812
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Authors:Paul F. Fewster
Pages:314 pages.
Year:2003
Editon:2nd ed
Publisher:Imperial College Press
Language:english
File Size:7.26 MB
Format:pdf
ISBNS:9781860943607, 1860943608
Categories: Ebooks

Product desciption

(Ebook) X-Ray Scattering from Semiconductors by Paul F. Fewster ISBN 9781860943607, 1860943608

Fewster (Philips Analytical Research Center, UK) discusses the X-ray scattering methods used for the structural analysis of a range of semiconductor materials, emphasizing those structural properties that influence physical properties. The text covers the basic structural characteristics of materials, the theory of X-ray scattering, the principles of the instrumentation, and a number of examples of analyses. The analysis section covers bulk semiconductor materials, nearly perfect semiconductor multi-layer structures, mosaic structures, partially relaxed multi-layer structures, laterally inhomogeneous multi-layers, textured polycrystalline semiconductors, and nearly perfect polycrystalline materials.
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