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(Ebook) VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen ISBN 9780080474793, 9780123705976, 0080474799, 0123705975

  • SKU: EBN-1695526
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5.0

18 reviews
Instant download (eBook) VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) after payment.
Authors:Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Pages:808 pages.
Year:2006
Editon:1
Language:english
File Size:6.82 MB
Format:pdf
ISBNS:9780080474793, 9780123705976, 0080474799, 0123705975
Categories: Ebooks

Product desciption

(Ebook) VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen ISBN 9780080474793, 9780123705976, 0080474799, 0123705975

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
-   Most up-to-date coverage of design for testability. 
- · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
- · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
-   Lecture slides and exercise solutions for all chapters are now available.
- · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
*Free conversion of into popular formats such as PDF, DOCX, DOC, AZW, EPUB, and MOBI after payment.

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