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(Ebook) VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers by S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh ISBN 9789811359491, 9789811359507, 9811359490, 9811359504

  • SKU: EBN-9961424
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Instant download (eBook) VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers after payment.
Authors:S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh
Pages:0 pages.
Year:2019
Editon:1st ed.
Publisher:Springer Singapore
Language:english
File Size:86.95 MB
Format:pdf
ISBNS:9789811359491, 9789811359507, 9811359490, 9811359504
Categories: Ebooks

Product desciption

(Ebook) VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers by S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh ISBN 9789811359491, 9789811359507, 9811359490, 9811359504

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

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