(Ebook) Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition by Gernot Friedbacher, Henning Bubert ISBN 9783527320479, 9783527636921, 3527320474, 3527636927

(Ebook) Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition by Gernot Friedbacher, Henning Bubert ISBN 9783527320479, 9783527636921, 3527320474, 3527636927

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)Content: Chapter 1 Introduction (pages 1–5): John C. Riviere and Dr. Henning BubertChapter 2 X?Ray Photoelectron Spectroscopy (XPS) (pages 7–41): Dr. Henning Bubert, John C. Riviere and Wolfgang S. M. WernerChapter 3 Auger Electron Spectroscopy (AES) (pages 43–65): Dr. Henning Bubert, John C. Riviere and Wolfgang S. M. WernerChapter 4 Electron Energy?Loss Spectroscopy (EELS) and Energy?Filtering Transmission Electron Microscopy (EFTEM) (pages 67–91): Reinhard SchneiderChapter 5 Low?Energy Electron Diffraction (LEED) (pages 93–109): Georg HeldChapter 6 Other Electron?Detecting Techniques (pages 111–113): John C. RiviereChapter 7 Static Secondary Ion Mass Spectrometry (SSIMS) (pages 115–139): Heinrich F. ArlinghausChapter 8 Dynamic Secondary Ion Mass Spectrometry (SIMS) (pages 141–159): Herbert HutterChapter 9 Electron?Impact (EI) Secondary Neutral Mass Spectrometry (SNMS) (pages 161–177): Michael Kopnarski and Holger JenettChapter 10 Laser Secondary Neutral Mass Spectrometry (Laser?SNMS) (pages 179–189): Heinrich F. ArlinghausChapter 11 Rutherford Backscattering Spectroscopy (RBS) (pages 191–202): Leopold PalmetshoferChapter 12 Low?Energy Ion Scattering (LEIS) (pages 203–215): Peter BauerChapter 13 Elastic Recoil Detection Analysis (ERDA) (pages 217–227): Oswald BenkaChapter 14 Nuclear Reaction Analysis (NRA) (pages 229–236): Oswald BenkaChapter 15 Field Ion Microscopy (FIM) and Atom Probe (AP) (pages 237–260): Yuri Suchorski and Wolfgang DrachselChapter 16 Other Ion?Detecting Techniques (pages 261–264): John C. RiviereChapter 17 Total?Reflection X?Ray Fluorescence (TXRF) Analysis (pages 265–292): Laszlo Fabry, Siegfried Pahlke and Burkhard BeckhoffChapter 18 Energy?Dispersive X?Ray Spectroscopy (EDXS) (pages 293–310): Reinhard SchneiderChapter 19 Grazing Incidence X?Ray Methods for Near?Surface Structural Studies (pages 311–327): P. Neil GibsonChapter 20 Glow Discharge Optical Emission Spectroscopy (GD?OES) (pages 329–344): Volker Hoffmann and Alfred QuentmeierChapter 21 Surface Analysis by Laser Ablation (pages 345–355): Roland Hergenroder and Michail BolshovChapter 22 Ion Beam Spectrochemical Analysis (IBSCA) (pages 357–366): Volker RupertusChapter 23 Reflection Absorption IR Spectroscopy (RAIRS) (pages 367–375): Karsten HinrichsChapter 24 Surface Raman Spectroscopy (pages 377–391): Wieland Hill and Bernhard LendlChapter 25 UV?VIS?IR Ellipsometry (ELL) (pages 393–405): Bernd Gruska and Karsten HinrichsChapter 26 Sum Frequency Generation (SFG) Spectroscopy (pages 407–435): Gunther Rupprechter and Athula BandaraChapter 27 Other Photon?Detecting Techniques (pages 437–438): John C. RiviereChapter 28 Introduction (pages 439–442): Prof. Dr. Gernot FriedbacherChapter 29 Atomic Force Microscopy (AFM) (pages 443–464): Prof. Dr. Gernot FriedbacherChapter 30 Scanning Tunneling Microscopy (STM) (pages 465–480): Prof. Dr. Gernot FriedbacherChapter 31 Scanning Near?Field Optical Microscopy (SNOM) (pages 481–497): Marc Richter and Volker Deckert