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(Ebook) Surface Analysis - The Principal Techniques, 2nd Edition by John C. Vickerman, Ian S. Gilmore ISBN 9780470017630, 9780470721582, 0470017635, 0470721588

  • SKU: EBN-4312754
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Authors:John C. Vickerman, Ian S. Gilmore
Pages:679 pages.
Year:2009
Publisher:Wiley
Language:english
File Size:90.65 MB
Format:pdf
ISBNS:9780470017630, 9780470721582, 0470017635, 0470721588
Categories: Ebooks

Product desciption

(Ebook) Surface Analysis - The Principal Techniques, 2nd Edition by John C. Vickerman, Ian S. Gilmore ISBN 9780470017630, 9780470721582, 0470017635, 0470721588

This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.  Content: Chapter 1 Introduction (pages 1–8): John C. VickermanChapter 2 Auger Electron Spectroscopy (pages 9–45): Hans Jorg MathieuChapter 3 Electron Spectroscopy for Chemical Analysis (pages 47–112): Buddy D. Ratner and David G. CastnerChapter 4 Molecular Surface Mass Spectrometry by SIMS (pages 113–205): John C. VickermanChapter 5 Dynamic SIMS (pages 207–268): David McPhail and Mark DowsettChapter 6 Low?Energy Ion Scattering and Rutherford Backscattering (pages 269–331): Edmund TaglauerChapter 7 Vibrational Spectroscopy from Surfaces (pages 333–390): Martyn E. Pemble and Peter GardnerChapter 8 Surface Structure Determination by Interference Techniques (pages 391–478): Christopher A. LucasChapter 9 Scanning Probe Microscopy (pages 479–562): Graham J. LeggettChapter 10 The Application of Multivariate Data Analysis Techniques in Surface Analysis (pages 563–612): Joanna L. S. Lee and Ian S. Gilmore
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