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(Ebook) Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices by Yasuo Cho ISBN 9780128172469, 0128172460

  • SKU: EBN-11184110
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Instant download (eBook) Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices after payment.
Authors:Yasuo Cho
Pages:256 pages.
Year:2020
Editon:1
Publisher:Woodhead Publishing
Language:english
File Size:20.95 MB
Format:pdf
ISBNS:9780128172469, 0128172460
Categories: Ebooks

Product desciption

(Ebook) Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices by Yasuo Cho ISBN 9780128172469, 0128172460

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials.

The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.

*Free conversion of into popular formats such as PDF, DOCX, DOC, AZW, EPUB, and MOBI after payment.

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