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(Ebook) Reliability, Robustness and Failure Mechanisms of LED Devices. Methodology and Evaluation by Yannick Deshayes, Laurent Béchou ISBN 9780081010884, 9781785481529, 0081010885, 1785481525

  • SKU: EBN-5602312
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Instant download (eBook) Reliability, Robustness and Failure Mechanisms of LED Devices. Methodology and Evaluation after payment.
Authors:Yannick Deshayes, Laurent Béchou
Pages:172 pages.
Year:2016
Editon:1
Publisher:ISTE Press - Elsevier
Language:english
File Size:25.16 MB
Format:pdf
ISBNS:9780081010884, 9781785481529, 0081010885, 1785481525
Categories: Ebooks

Product desciption

(Ebook) Reliability, Robustness and Failure Mechanisms of LED Devices. Methodology and Evaluation by Yannick Deshayes, Laurent Béchou ISBN 9780081010884, 9781785481529, 0081010885, 1785481525

Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance―before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate lifetime distribution can then be proposed.Deals exclusively with reliability, based on the physics of failure for infrared LEDsIdentifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applicationsUses a complete methodology to reduce the number of samples needed to estimate lifetime distributionFocuses on the method to extract fundamental parameters from electrical and optical characterizations
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