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(Ebook) Reliability of multiphysical systems set. Volume 2, Nanometer-scale defect detection using polarized light by Dahoo, Pierre Richard; El Hami, Abdelkhalak; Pougnet, Philippe ISBN 9781119329657, 9781848219366, 1119329655, 1848219369

  • SKU: EBN-5700538
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Instant download (eBook) Reliability of multiphysical systems set. Volume 2, Nanometer-scale defect detection using polarized light after payment.
Authors:Dahoo, Pierre Richard; El Hami, Abdelkhalak; Pougnet, Philippe
Pages:320 pages.
Year:2016
Editon:1
Publisher:Wiley-ISTE
Language:english
File Size:10.08 MB
Format:pdf
ISBNS:9781119329657, 9781848219366, 1119329655, 1848219369
Categories: Ebooks

Product desciption

(Ebook) Reliability of multiphysical systems set. Volume 2, Nanometer-scale defect detection using polarized light by Dahoo, Pierre Richard; El Hami, Abdelkhalak; Pougnet, Philippe ISBN 9781119329657, 9781848219366, 1119329655, 1848219369

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
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