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Rapid cryogenic characterization of 1,024 integrated silicon quantum dot devices by Edward J. Thomas & Virginia N. Ciriano-Tejel & David F. Wise & Domenic Prete & Mathieu de Kruijf & David J. Ibberson & Grayson M. Noah & Alberto Gomez-Saiz & M. Fernando Gonzalez-Zalba & Mark A. I. Johnson & John J. L. Morton instant download

  • SKU: EBN-239923380
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Instant download (eBook) Rapid cryogenic characterization of 1,024 integrated silicon quantum dot devices after payment.
Authors:Edward J. Thomas & Virginia N. Ciriano-Tejel & David F. Wise & Domenic Prete & Mathieu de Kruijf & David J. Ibberson & Grayson M. Noah & Alberto Gomez-Saiz & M. Fernando Gonzalez-Zalba & Mark A. I. Johnson & John J. L. Morton
Pages:updating ...
Year:2025
Publisher:x
Language:english
File Size:6.93 MB
Format:pdf
Categories: Ebooks

Product desciption

Rapid cryogenic characterization of 1,024 integrated silicon quantum dot devices by Edward J. Thomas & Virginia N. Ciriano-Tejel & David F. Wise & Domenic Prete & Mathieu de Kruijf & David J. Ibberson & Grayson M. Noah & Alberto Gomez-Saiz & M. Fernando Gonzalez-Zalba & Mark A. I. Johnson & John J. L. Morton instant download

Nature Electronics, doi:10.1038/s41928-024-01304-y
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