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(Ebook) High-k Gate Dielectric Materials: Applications with Advanced Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) by Niladri Pratap Maity (editor), Reshmi Maity (editor), Srimanta Baishya (editor) ISBN 9780429325779, 9781771888431, 9782020015813, 0429325770, 1771888431, 2020015811, 2020015812

  • SKU: EBN-35374380
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Instant download (eBook) High-k Gate Dielectric Materials: Applications with Advanced Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) after payment.
Authors:Niladri Pratap Maity (editor), Reshmi Maity (editor), Srimanta Baishya (editor)
Pages:264 pages.
Year:2020
Editon:1
Publisher:Apple Academic Press
Language:english
File Size:36.83 MB
Format:pdf
ISBNS:9780429325779, 9781771888431, 9782020015813, 0429325770, 1771888431, 2020015811, 2020015812
Categories: Ebooks

Product desciption

(Ebook) High-k Gate Dielectric Materials: Applications with Advanced Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) by Niladri Pratap Maity (editor), Reshmi Maity (editor), Srimanta Baishya (editor) ISBN 9780429325779, 9781771888431, 9782020015813, 0429325770, 1771888431, 2020015811, 2020015812

This volume explores and addresses the challenges of high-k gate dielectric materials, one of the major concerns in the evolving semiconductor industry and the International Technology Roadmap for Semiconductors (ITRS). The application of high-k gate dielectric materials is a promising strategy that allows further miniaturization of microelectronic components.This book presents a broad review of SiO2 materials, including a brief historical note of Moore’s law, followed by reliability issues of the SiO2 based MOS transistor. It goes on to discuss the transition of gate dielectrics with an EOT ~ 1 nm and a selection of high-k materials. A review of the various deposition techniques of different high-k films is also discussed. High-k dielectrics theories (quantum tunneling effects and interface engineering theory) and  applications of different novel MOSFET structures, like tunneling FET, are also covered in this book.The volume also looks at the important issues in the future of CMOS technology and presents an analysis of interface charge densities with the high-k material tantalum pentoxide. The issue of CMOS VLSI technology with the high-k gate dielectric materials is covered as is the advanced MOSFET structure, with its working structure and modeling.This timely volume will prove to be a valuable resource on both the fundamentals and the successful integration of high-k dielectric materials in future IC technology.
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